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MSF - Authors (Kaniewska, M.)

ISSN: 1662-9752

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• p1457 Deep States Associated with Copper Decorated Oxidation Induced Stacking Faults in Silicon
  Authors: M. Kaniewska, J. Kaniewski, Anthony R. Peaker
• p1463 Electrical Properties of Oxidation-Induced Stacking Faults in N-Type Silicon
  Authors: J. Kaniewski, M. Kaniewska, Anthony R. Peaker
• p1511 Au-Related Deep States in the Presence of Extended Defects in N-Type Silicon
  Authors: M. Kaniewska, J. Kaniewski, Anthony R. Peaker
• p1517 Interaction between Supersaturated Transition Metals (Cu, Ni, Fe) and Extended Defects in CZ-Si
  Authors: J. Jablonski, J. Kaniewski, M. Kaniewska, Takashi Sekiguchi, L. Ornoch, Koji Sumino
• p319 Hydrogenation of Copper Related Deep States in n-Type Si Containing Extended Defects
  Authors: J. Kaniewski, M. Kaniewska, L. Ornoch, Takashi Sekiguchi, Koji Sumino
• p325 Hydrogenation of Deep Defect States in n-Type Si Containing Extended Defects and Transition Metal (Ni or Fe)
  Authors: M. Kaniewska, J. Kaniewski, L. Ornoch, Takashi Sekiguchi, Koji Sumino