Solid State Phenomena - X-Ray Diffraction (XRD)

p7 Luminescence Properties of Neodymium-Doped Yttrium Aluminium Garnet Obtained by the Co-Precipitation Method Combined with the Mechanical Process
Authors: Eugenio Caponetti, Maria Luisa Saladino, D. Chillura Martino, L. Pedone, Stefano Enzo, S. Russu, M. Bettinelli, A. Speghini

p17 Defect Formation in Heavily As-Doped Cz Si
Authors: S. Rouvimov, R. Kuytt, J. Kearns, V. Todt, B. Orschel, H. Siriwardane, A. Buczkowski, I. Shul'pina, George A. Rozgonyi

p23 Formation of Lanthanum Hydroxide and Oxide via Precipitation
Authors: So Jin Kim, Won Kyu Han, Sung Goon Kang, Min Su Han, Young Hun Cheong

p25 Sensitivity of Zn_1-xCd_x Te to Tera-Hertz Signals Enhanced by Structural Orderings
Authors: S.W. Han, S.H. Kang

p27 Full Pattern Methods for the Analysis of Plastically Deformed Materials
Authors: Paolo Scardi, Matteo Leoni, Mirco D'Incau

p33 Advances in Structural Characterization of Thin Film Nanocrystalline Silicon for Photovoltaic Applications
Authors: Alessia Le Donne, Simona Binetti, Giovanni Isella, Bernard Pichaud, Michael Texier, Maurizio Acciarri, Sergio Pizzini

p43 Thickness Measurement of Thin Textured Films by a Novel X-Ray Diffraction Method Accounting for Secondary Extinction
Authors: I. Tomov, S. Vassilev

p49 Local Orientation Measurements in 3D
Authors: Dorte Juul Jensen

p53 In-Plane Rotated Crystal Structure in Continuous Growth of Bismuth Cuprate Superconducting Film
Authors: Satoru Kaneko, Kensuke Akiyama, Takeshi Ito, Yasuo Hirabayashi, Hiroshi Funakubo, Mamoru Yoshimoto

p59 Interdiffusion of Two L1₀Phases without Long-Range Order Decrease: Experiments and Molecular Dynamics Simulations
Authors: Christine Goyhenex, R.V.P. Montsouka, Mirosław Kozłowski, Veronique Pierron-Bohnes

SSP - Keywords (X-Ray Diffraction (XRD))