MgB2 Composite Superconductors Made by Ex Situ and In Situ Process

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Generally, two basic routes called as in-situ and ex-situ process are used for composite MgB2 wires now. Mentioned processes have been used for making of single-core composite wires. The applied heat treatment parameters influence the microstructure of MgB2 phase, critical temperature and critical current density, but it has also decisive effect on the MgB2/metal reaction. It was found that the transport current densities are much more sensitive to the used sheath material than critical temperatures. The main factors limiting the transport current density are cracks introduced by deformation and porosity caused by the boron diffusion in ex-situ and in-situ wires, respectively.

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131-136

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October 2006

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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[1] Y. Zhao, Y. Feng, C. H. Cheng, L. Zhou, Y. Wu, T. Machi, Y. Fudamoto, N. Koshizura, M. Murakami: Appl. Phys. Lett. Vol. 79 (2001), p.1145.

Google Scholar

[2] H. L. Suo, C. Beneduce, M. Dhallé, N. Musolino, J. E. Genoud and R. Flűkiger: Appl. Phys. Lett. Vol. 79 (2001), p.3116.

DOI: 10.1063/1.1415349

Google Scholar

[3] M. R. Cimberle, P. Novak, P. Manfrinetti and A. Palenzona: Sup. Sci. and Technol. Vol. 15 (2002), p.43.

Google Scholar

[4] P. Kováč, I. Hušek and T. Melišek: Sup. Sci. and Technol. Vol. 15 (2002), p.1340.

Google Scholar

[5] X. Dou, J. Horvath, S. Soltanian, X. L. Wang, M. J. Qin, S. H. Zhou, H. K. Liu and P.G. Munroe: IEEE Trans on Appl. Supercond. Vol. 13 (2003), p.3199.

Google Scholar

[6] B. Q. Fu, Y. Feng, G. Yang, C. F. Liu, L. Zhou, L. Z. Cao, K. Q. Ruan, X. G. Li: Physica C Vol. 392-396 (2003), p.1035.

Google Scholar

[7] P. Kováč, I. Hušek, T. Melišek and V. Štrbík: Sup. Sci. and Technol. Vol. 18 (2005), p.856.

Google Scholar

[8] W. Pachla, A. Presz, P. Kováč, I. Hušek and R. Diduszko: Sup. Sci. and Technol. Vol. 17 (2004), p.1289.

Google Scholar

[9] G. Grasso, A. Malagoli, C. Ferdeghini, S. Roncallo, V. Braccini, M. R. Cimberle and A. S. Siri: Appl. Phys. Lett. Vol. 79 (2001), p.230.

DOI: 10.1063/1.1384905

Google Scholar

[10] A. Yamamoto, J. Shimojama, S. Ueda, Y. Katsura, S. Horii, K. Kishio: Sup. Sci. and Technol. Vol. 17 (2004), p.921.

Google Scholar

[11] H. Kumakura, A. Matsumoto, H. Fujii, K. Togano: Appl. Phys. Lett. Vol. 79 (2001), p.2435.

Google Scholar

[12] W. Goldacker, S. I. Schlachter, C. Zimmer, H. Reiner: Sup. Sci. and Technol. Vol. 14 (2001), p.787.

Google Scholar

[13] Y. Feng , G. Yan, Y. Zhao, C. F. Liu, B. Q. Fu, L. Zhou, L. Z. Cao, K. Q. Ruan, X. G. Li, L. Shi and Y. H. Zhang: Physica C Vol. 386 (2003), p.598.

Google Scholar

[14] B. Q. Fu, Y. Feng, G. Yan, C. F. Liu, L. Zhou, L. Z. Cao, K. Q. Ruan, X. G. Li: Physica C Vol. 392 (2003), p.1035.

Google Scholar

[15] P. Kováč, I. Hušek, T. Melišek, M. Kulich and V. Štrbík: will be published by Sup. Sci. and Technol. Vol. 19 (2006), p.

Google Scholar