Investigations of High Strain Deformation Using Model Composite Systems
p.217
p.217
Dislocations in Multilayers
p.233
p.233
Plastic Deformation of Nanocrystalline Metals
p.249
p.249
Dislocations in Silicon Based Heterostructures
p.263
p.263
Contributions of Scanning Probe Microscopy and Spectroscopy to the Investigation of Microstructures and Their Physical Properties
p.281
p.281
Continuum Modelling of Interfacial Decohesion
p.287
p.287
Organization of Rupture
p.303
p.303
Environment Sensitive Fracture Mechanisms
p.319
p.319
Soft Magnetic Materials: Microstructure and Properties
p.335
p.335
Contributions of Scanning Probe Microscopy and Spectroscopy to the Investigation of Microstructures and Their Physical Properties
Abstract:
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Periodical:
Solid State Phenomena (Volumes 35-36)
Pages:
281-286
DOI:
Citation:
Online since:
September 1993
Authors:
Keywords:
Atomic Force Microscope (AFM), Atomic-Resolution Topography, Chemical Contrast, Dislocation, Elastic Property, Force Spectroscopy, Local Probe Methods, Magnetic Contrast, Magnetic Force Microscopy (MFM), Near-Field Microscopy, Plastic Deformation, Scanning Tunneling Microscopy, Scanning Tunneling Spectroscopy, Spin-Polarized Scanning Tunneling Microscopy
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Сopyright:
© 1993 Trans Tech Publications Ltd. All Rights Reserved
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