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Grain Boundary Diffusion and Grain Boundary Segregation

Defect and Diffusion Forum Volume 156

• Papers
• Abstracts

• p85 A New Method for Grain Boundary Diffusion Coefficient Measurement   [ 591 K ]
  Authors: René Le Gall, Guy Saindrenan, D. Roptin
• p95 Complex Atomic-Scale Dynamics in Grain Boundaries in Silicon   [ 28 K ]
  Authors: Sokrates T. Pantelides, A. Maiti, M.F. Chisholm, S.J. Pennycook
• p97 Relation Between Segregation at Interfaces, Structure and Diffusion in Germanium   [ 480 K ]
  Authors: A. Charaї, Andree Rolland, F. Cabané
• p107 Microscopic Investigation of Surface Segregation in Random Alloys   [ 579 K ]
  Authors: A.Yu. Lozovoi, P.A. Korzhavyi, Yu.Kh. Vekilov
• p121 Segregation, Phase Separation and Grain Boundary Diffusion in Thin Films   [ 550 K ]
  Authors: C. Cserháti, D.L. Beke, I.A. Szabó
• p129 AES Study of the Mass Transport of Nickel Near Ni / Cu (111) Interface   [ 327 K ]
  Authors: Zs. Tôkei, D.L. Beke, Jean Bernardini, Andree Rolland
• p135 Grain Boundary Segregation in the Cu-Bi System   [ 559 K ]
  Authors: L.S. Chang, Eugen Rabkin, Boris Straumal, S. Hofmann, B. Baretzky, W. Gust
• p147 Grain Boundary Electromigration in Thin Films: Interface Reaction and Segregation Effects   [ 888 K ]
  Authors: Evgeny E. Glickman
• p161 Grain Boundary Diffusion, Electromigration and Segregation in Cu and Cu-2wt% Sn Alloy   [ 28 K ]
  Authors: D. Gupta
• p163 The Effect of Pressure on Grain Boundary Wetting, Segregation and Diffusion   [ 825 K ]
  Authors: Witold Łojkowski, Eugen Rabkin, Boris Straumal, Lasar S. Shvindlerman, W. Gust