Beam Injection Assessment of Defects in Semiconductors
Solid State Phenomena Volumes 63 - 64
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p519
Stress Measurements in sub-μm Si Structures Using Raman Spectroscopy
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300 K
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Authors: K.F. Dombrowski, I. De Wolf -
p525
Two Dimensional Mapping of pn Junctions by Electron Holography
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223 K
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Authors: W.D. Rau, P. Schwander, A. Ourmazd -
p529
The Future of Beam Injection Techniques: Summary of the Round-Table Discussion Held at BIADS 98
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79 K
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Authors: A. Endrös, A. Jakubowicz, Zbigniew J. Radzimski
