HOME CONTACT

Username: Password:

> @scientific.net

Polycrystalline Semiconductors V

Solid State Phenomena Volumes 67 - 68

• Papers
• Abstracts

• p415 Photoelectrical Properties of In/p-(Cu,Ag)(In,Ga) (Se,Te)₂ Surface-Barrier Structures   [ 300 K ]
  Authors: Yu. V. Rud', V.Yu. Rud', V.F. Gremenok, E.P. Zaretskaya, D.D. Krivolap, I.V. Bodnar, S.L. Sergeev-Nekrasov
• p421 Polarization Photosensitivity of Polycrystalline-Film Cu(In,Ga)Se₂/CdS/ZnO Structures   [ 212 K ]
  Authors: V.Yu. Rud', Yu. V. Rud', H.-W. Schock
• p427 Photoluminescence Study of Cu(Ga_xIn_1-x)₃Se₅ and CuIn₃(S_xSe_1-x)₅ Crystals with 0≤x≤1   [ 194 K ]
  Authors: F. Guastavino, K. Zeaiter, L. Djellal, Yanuar, D. Bayaa, M. Abdelali, C. Llinares
• p435 Fullerene-Based Thin Films as a Novel Polycrystalline Semiconductor   [ 747 K ]
  Authors: E.A. Katz
• p447 Low Dislocation Density Multicrystalline Silicon for Photovoltaic Applications   [ 427 K ]
  Authors: C. Häßler, E.-U. Reisner, Wolfgang Koch, A. Müller, D. Franke, T. Rettelbach
• p453 Phase Field Modeling of the Growth of mc-Silicon from the Melt   [ 328 K ]
  Authors: Markus Apel, Ingo Steinbach
• p459 Low-Temperature Silicon Epitaxy by Ion-Assisted Deposition   [ 370 K ]
  Authors: L. Oberbeck, R.B. Bergmann, N. Jensen, S. Oelting, Jens Werner
• p465 Profiled Poly-Silicon Films by Hot-Wire Chemical Vapour Deposition for Solar Cells on Cheap Metal Substrate   [ 651 K ]
  Authors: Jatindra K. Rath, F.D. Tichelaar, Ruud E.I. Schropp
• p471 Optical Characterization of Ru₂Si₃ and Ru₂Ge₃ by Various Spectroscopic Methods and by Band Structure Calculations   [ 278 K ]
  Authors: W. Henrion, M. Rebien, V.N. Antonov, O. Jepsen
• p477 Cubic Silicon Carbide Films Grown by Reactive Magnetron Sputtering at Relatively Low Temperature   [ 322 K ]
  Authors: S. Kerdiles, F. Gourbilleau, Richard Rizk, J.L. Pérez-Rodríguez, B. Garrido, O. González-Varona, L. Calvo-Barrio, J.R. Morante