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Polycrystalline Semiconductors V

Solid State Phenomena Volumes 67 - 68

• Papers
• Abstracts

• p485 Defect Engineering in Polycrystalline Silicon Using Ultrasound   [ 551 K ]
  Authors: Sergei S. Ostapenko
• p497 Defects Modification by Ultrasound in Crystals   [ 320 K ]
  Authors: I.V. Ostrovskii, Ju.M. Khalack, A.B. Nadtochii, H.G. Walther
• p503 Method for the Evaluation of the Influence of Gettering and Bulk Passivation on Non-Uniform Block-Cast Multicrystalline Si Solar Cells   [ 383 K ]
  Authors: H. Nagel, A.G. Aberle, S. Narayanan
• p509 Influence of Hydrogen Plasma Treatment on Electric Properties of Polycrystalline CdS_xSe_1-x Films   [ 345 K ]
  Authors: S. Manego, A.V. Mazanik, M. Tarasik, Yu. Trofimov, A.K. Fedotov, Alexander G. Ulyashin, A. Yanchenko
• p515 Wet-Chemically Passivated Silicon Interfaces: Characterization by Surface Photovoltage Measurements, and Spectroscopic Ellipsometry Methods   [ 380 K ]
  Authors: H. Angermann, W. Henrion, A. Röseler, M. Rebien
• p521 Improving the Quality of Polycrystalline Silicon String Ribbon for Fabricating High Efficiency Solar Cells   [ 417 K ]
  Authors: H.E.A. Elgamel, J. Gobrecht
• p529 Polycrystalline Silicon Thin Film Transistors: State of the Art and Improvement of Electrical Characteristics   [ 756 K ]
  Authors: O. Bonnaud
• p541 Leakage Current of Unhydrogenated Solid Phase Crystallized Silicon Thin Film Transistors   [ 302 K ]
  Authors: B. Tala-Ighil, A. Rahal, H. Toutah, T. Mohammed-Brahim, K. Mourgues, O. Bonnaud
• p547 Process to Fabricate High Performance Solid Phase Crystallized n-Type and p-Type Thin Film Transistors on Glass Substrate   [ 241 K ]
  Authors: K. Mourgues, F. Raoult, Youri Helen, T. Mohammed-Brahim, R. Rogel, O. Bonnaud
• p553 An Analytical Model for Rectifying Contacts on Polycrystalline Semiconductors   [ 298 K ]
  Authors: U. Rau, Jens Werner