HOME CONTACT

Username: Password:

> @scientific.net

Gettering and Defect Engineering in Semiconductor Technology VIII

Solid State Phenomena Volumes 69 - 70

• Papers
• Abstracts

• p491 Structural and Electrical Quality of Silicon Bicrystals Fabricated by a Modified Direct Bonding Technique   [ 258 K ]
  Authors: T.S. Argunova, Mikhail Yu. Gutkin, L.S. Kostina, T.V. Kudriavtseva, Eun Dong Kim, Sang Cheol Kim
• p497 Formation of Spatial Inhomogeneities as a Result of Heat Treatment in Silicon Doped with Zinc   [ 338 K ]
  Authors: E.V. Astrova, V.B. Voronkov, A.A. Lebedev, A.N. Lodygin, A.D. Remenyuk
• p503 Magnetoplastic Effect in Compound Semiconductors   [ 162 K ]
  Authors: E.V. Darinskaya, E.A. Petrzhik, S.A. Erofeeva, V.P. Kisel
• p507 Reconstruction of GaAs/AlAs (311) and (100) Interfaces: Raman Study   [ 321 K ]
  Authors: M.D. Efremov, V.A. Volodin, V.V. Bolotov, V.A. Sachkov, G.A. Lubas, V.V. Preobrazhenski, B.R. Semyagin
• p513 Simulation of Point Defect Diffusion in Semiconductors   [ 256 K ]
  Authors: O.I. Velichko, A.K. Fedotov
• p519 Correlation between Intrinsic Stress Distribution and Crystallographic Defects Density Profile in Czochralski Silicon after CMOS Processing   [ 374 K ]
  Authors: T. Piotrowski, W. Jung
• p525 Silicon Impurity-Related Effects on Structural Defects in III-V Nitrides   [ 359 K ]
  Authors: N. Shmidt, V. Busov, Valentin V. Emtsev, R. Kyutt, W. Lundin, D.S. Poloskin, V.V. Ratnikov, A.V. Sakharov, A. Usikov
• p531 Reconstruction of Deep Level Defect Distribution from DLTS Measurements in Compensated Semiconductors   [ 342 K ]
  Authors: O.A. Soltanovich, E.B. Yakimov, Nikolai Yarykin
• p539 Identification of Process Induced Defects in Silicon Power Devices   [ 306 K ]
  Authors: E.V. Astrova, V.A. Kozlov, A.A. Lebedev, V.B. Voronkov
• p545 Nondestructive Defect Characterization and Engineering in Contemporary Silicon Power Devices   [ 360 K ]
  Authors: Pavel Hazdra, Jan Vobecký