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Defects and Diffusion in Semiconductors

Defect and Diffusion Forum Volumes 183 - 185

• Papers
• Abstracts

• p147 Defects and Morphologies in In_0.8Ga_0.2As/InAlAs/InP(001) for High Electron-Mobility Transistors   [ 381 K ]
  Authors: J. Wu, F. Lin
• p153 Diffusion of Zinc in InP, InAsP and InGaAs by the Metal-Organic Vapor-Phase Diffusion Technique   [ 542 K ]
  Authors: M. Wada, K. Sakakibara, T. Umezawa, S. Nakajima, S. Araki, T. Kudou, T. Ueda
• p163 Effect of Implant Temperature on Extended Defects Craeted by Ion Implantation in Silicon   [ 362 K ]
  Authors: J. Wong-Leung, S. Fatima, C. Jagadish, J.D. FitzGerald
• p171 Diffusion and Electrical Properties of Nickel in Silicon   [ 457 K ]
  Authors: S. Tanaka, T. Ikari, H. Kitagawa
• p181 XPEEM Study of Liquid Au-Si Droplets on Si(111) near to the Eutectic Point   [ 534 K ]
  Authors: B. Ressel, S. Heun, T. Schmidt, K.C. Prince
• p189 Effect of Surface Proximity upon Point Defects in Silicon   [ 410 K ]
  Authors: V. Krishnamoorthy, M. Puga Lambers, Kevin S. Jones
• p199 Energetics of Extrinsic Defects in Si and their Role in Nonequilibrium Dopant Diffusion   [ 419 K ]
  Authors: Fuccio Cristiano, B. Colombeau, A. Claverie
• p207 Study of Diffusion and Defects by Medium-Energy Coaxial Impact-Collision Ion Scattering Spectroscopy   [ 410 K ]
  Authors: Takayuki Kobayashi, C.F. McConville, J. Nakamura, G. Dorenbos, H. Sone, T. Katayama, M. Aono
• p215 Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers   [ 1 M ]
  Authors: K.K. Fung, Ning Wang
• p231 Analytical In-Diffusion Profiles of Dopants in Semiconductors   [ 398 K ]
  Authors: E. Antoncik