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Beam Injection Assessment of Microstructures in Semiconductors

Solid State Phenomena Volumes 78 - 79

• Papers
• Abstracts

• p3 Impurity Concentration Mapping in Mulitcrystalline Silicon Wafers   [ 452 K ]
  Authors: Santo Martinuzzi, Olivier Palais
• p11 Single Contact Beam Induced Current Phenomena - A Review   [ 403 K ]
  Authors: Daniel S.H. Chan, Jacob C.H. Phang, J.M. Chin, S. Kolachina
• p19 Challenging the Spatial Resolution Limits of CL and EBIC   [ 392 K ]
  Authors: Carl E. Norman
• p29 EBIC Investigation of a 3-Dimensional Network of Inversion Channels in Solar Cells on Silicon Ribbons   [ 531 K ]
  Authors: O. Breitenstein, M. Langenkamp, J.P. Rakotoniaina
• p39 Electrical Behaviour of Crystal Defects in Silicon Solar Cells   [ 581 K ]
  Authors: Martin Kittler, Winfried Seifert, O. Krüger
• p49 LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid   [ 538 K ]
  Authors: A. Fave, J.P. Boyeaux, Mustapha Lemiti, A. Laugier, P. Kleimann, Jan Linnros
• p57 Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon   [ 363 K ]
  Authors: Sergio Pizzini, Simona Binetti, Alessia Le Donne, E. Leoni, Maurizio Acciarri, G. Salviati, L. Lazzarini
• p65 Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC   [ 547 K ]
  Authors: O.F. Vyvenko, O. Krüger, Martin Kittler
• p73 Simulation of EBIC Contrast for Extended Defects Inclined to the Surface   [ 255 K ]
  Authors: V.V. Sirotkin, E.B. Yakimov
• p79 Reconstruction of Diffusion Length Distribution by the Modulated EBIC and OBIC   [ 342 K ]
  Authors: E.B. Yakimov