HOME CONTACT

Username: Password:

> @scientific.net

Gettering and Defect Engineering in Semiconductor Technology X

Solid State Phenomena Volumes 95 - 96

• Papers
• Abstracts

• p135 High Resolution Deep Level Transient Spectroscopy of Hydrogen Interactions with Ion Implantation-Induced Defects in Silicon   [ 63 K ]
  Authors: J.H. Evans-Freeman, N. Abdulgader
• p141 Depth Resolved Defect Analysis by Micro-Raman Investigations of Plasma Hydrogenated Czochralski Silicon Wafers   [ 1007 K ]
  Authors: Reinhart Job, Yue Ma, Yue Long Huang, Alexander G. Ulyashin, Wolfgang R. Fahrner, Marie France Beaufort, Jean François Barbot
• p149 Casting Technologies for Solar Silicon Wafers: Block Casting and Ribbon-Growth-on-Substrate   [ 960 K ]
  Authors: Andreas Schönecker, L.J. Geerligs, Armin Müller
• p159 Silicon Ribbons for Solar Cells   [ 824 K ]
  Authors: Juris P. Kalejs
• p175 Metal Content of Multicrystalline Silicon for Solar Cells and its Impact on Minority Carrier Diffusion Length   [ 39 K ]
  Authors: Andrei A. Istratov, T. Buonassisi, R.J. McDonald, A.R. Smith, R. Schindler, James Rand, Juris P. Kalejs, Eicke R. Weber
• p181 Carbon-Induced Twinning in Multicrystalline Silicon   [ 2 M ]
  Authors: Hans Joachim Möller
• p187 Light-Induced Degradation in Crystalline Silicon Solar Cells   [ 171 K ]
  Authors: Jan Schmidt
• p197 Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations   [ 103 K ]
  Authors: Martin Kittler, Winfried Seifert
• p205 Minority Carrier Diffusion Lengths in Multi-Crystalline Silicon Wafers and Solar Cells   [ 51 K ]
  Authors: Daniela Cavalcoli, Anna Cavallini, Marco Rossi, Kristian Peter
• p211 Evaluation of Silicon Sheet Film Growth and Wafer Processing via Structural, Chemical and Electrical Diagnostics   [ 1 M ]
  Authors: George A. Rozgonyi, J. Lu, R. Zhang, James Rand, Ralf Jonczyk