Electromigration, Realistic Electromigration Lifetime Projection for Very Large-Scale Integration Interconnects

Materials Science & Technology

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10/18/2009 - 10/19/2009

APCCC-15: 15. Asian-Pacific corrosion control conference

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Abstract «Electromigration, Realistic Electromigration Lifetime Projection for Very Large-Scale Integration Interconnects»

ISBN / ISBN-13: 3-908450-89-6 / 978-3-908450-89-4
Page: A470