Surface Diffusion in the Low-Friction Limit - Occurrence of Long Jumps
a.508
a.508
Interface Diffusion under an Electric Field
a.509
a.509
Bulk Diffusion-Induced Grain Boundary Migration due to Elastic Anisotropy
a.510
a.510
Rapid Measurement of Diffusion Profiles by Using a Moving Schottky Contact
a.511
a.511
Diffusion in Intermetallics
a.512
a.512
Segregation-Controlled Kinetics of Fast Impurity Diffusion in Polycrystalline Solids
a.513
a.513
Non-Trivial Exponent for Simple Diffusion
a.514
a.514
Diffusion of Copper through Dielectric Films under Bias Temperature Stress
a.515
a.515
Novel Monte Carlo Approach to Single-Particle Diffusion
a.516
a.516
Diffusion in Intermetallics
Page: A512