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Defects and Diffusion in Semiconductors - An Annual Retrospective VII

Defect and Diffusion Forum Volumes 230 - 232

• Papers
• Abstracts

• p135 Classification of Defects on Semiconductor Wafers Using Priority Rules   [ 406 K ]
  Authors: N.G. Shankar, Z.W. Zhong, N. Ravi
• p149 Grown-In Lattice Defects and Diffusion in Czochralski-Grown Germanium   [ 1 M ]
  Authors: Jan Vanhellemont, Olivier De Gryse, Steven Hens, Piet Vanmeerbeek, Dirk Poelman, Paul Clauws, Eddy Simoen, C. Claeys, Igor Romandic, Antoon Theuwis, G. Raskin, H. Vercammen, P. Mijlemans
• p177 Mechanism of Formation and Physical Classification of the Grown-In Microdefects in Semiconductor Silicon   [ 1 M ]
  Authors: V.I. Talanin, I.E. Talanin
• p199 Nitrogen in Silicon   [ 1 M ]
  Authors: De Ren Yang, Xuegong Yu
• p221 Modelling of Staebler-Wronski Effect in Hydrogenated Amorphous Silicon under Moderate and Intense Illumination   [ 240 K ]
  Authors: A.F. Meftah, A.M. Meftah, A. Merazga
• p233 Defect Engineering in Impurity-Free Disordered (Al)GaAs for Optoelectronic Devices Application   [ 212 K ]
  Authors: Prakash N.K. Deenapanray