Gettering and Defect Engineering in Semiconductor Technology XI
Solid State Phenomena Volumes 108 - 109
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p515
Multicrystalline Silicon from Different Types of Bridgman Furnaces: Ingot and Cell Properties
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134 K
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Authors: Michael Ghosh, Marc Dietrich, Armin Müller, Stefan Peters, Detlef Sontag, Holger Neuhaus -
p519
Behaviour of Natural and Implanted Iron during Annealing of Multicrystalline Silicon Wafers
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161 K
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Authors: Daniel Macdonald, Thomas Roth, L.J. Geerligs, Andres Cuevas -
p525
Improved P-Type or Raw N-Type Multicrystalline Silicon Wafers for Solar Cells
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24 M
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Authors: Santo Martinuzzi, Francesca Ferrazza, Isabelle Périchaud -
p531
Investigation of Defects in the Edge Region of Multicrystalline Solar Silicon Ingots
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1 M
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Authors: M. Rossberg, M. Naumann, K. Irmscher, U. Juda, A. Lüdge, Michael Ghosh, Armin Müller -
p539
Electrical and Optical Characterization of Thin Semiconductor Layers for Advanced ULSI Devices
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574 K
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Authors: Eddy Simoen, C. Claeys, Eugenijus Gaubas, J.M. Rafí -
p547
DLTS Study on Deep Levels Formed in Plasma Hydrogenated and Subsequently Annealed Silicon
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269 K
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Authors: Yue Long Huang, Eddy Simoen, C. Claeys, Reinhart Job, Yue Ma, Wolfgang Düngen, Wolfgang R. Fahrner, J. Versluys, Paul Clauws -
p553
Defect Behaviour in Deuterated and Non-Deuterated n-Type Si
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24 M
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Authors: Jan H. Bleka, Edouard V. Monakhov, Alexander G. Ulyashin, F.D. Auret, Andrej Yu. Kuznetsov, B.S. Avset, B.G. Svensson -
p561
Thermal Stability of Ti/Mo Schottky Contacts on p-Si and Defects Introduced in p-Si during Electron Beam Deposition of Ti/Mo
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248 K
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Authors: F.D. Auret, A.G.M. Das, C. Nyamhere, M. Hayes, N.G. van der Berg -
p567
EBIC and DLTS Study of Deformation Induced Defect Thermal Stability in n-Si
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16 M
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Authors: O.V. Feklisova, E.B. Yakimov -
p571
Cobalt Contamination in Silicon
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423 K
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Authors: Maria-Luisa Polignano, Daniele Caputo, Davide Codegoni, Vittorio Privitera, M. Riva
