HOME CONTACT

Username: Password:

> @scientific.net

Gettering and Defect Engineering in Semiconductor Technology XII

Solid State Phenomena Volumes 131 - 133

• Papers
• Abstracts

• p497 Deep Level Transient Spectroscopy of Ultra Shallow Junctions in Si Formed by Implantation   [ 186 K ]
  Authors: Niki Mitromara, J.H. Evans-Freeman, Ray Duffy
• p503 Regular Dislocation Networks in Si. Part II: Luminescence   [ 1 M ]
  Authors: Teimuraz Mchedlidze, T. Wilhelm, X. Yu, T. Arguirov, G. Jia, M. Reiche, Martin Kittler
• p511 Mapping of Device Yield Relevant Electrical Si-Wafer Parameters   [ 618 K ]
  Authors: Kathrin Niemietz, Kay Dornich, Torsten Hahn, A. Helbig, Stefan Hellwig, Karl Heinz Stegemann, J.R. Niklas
• p517 Clustering of Gold on 6H-SiC and Local Nanoscale Electrical Properties   [ 394 K ]
  Authors: Francesco Ruffino, Filippo Giannazzo, Fabrizio Roccaforte, Vito Raineri, Maria Grazia Grimaldi
• p523 On the Failure of Intelligent Power Devices Induced by Extreme Electro-Thermal Fatigue. A Microstructural Analysis   [ 1 M ]
  Authors: Benjamin Khong, Marc Legros, Philippe Dupuy, Colette Levade, Guy Vanderschaeve
• p529 EBIC Investigations of Deformation Induced Defects in Si   [ 235 K ]
  Authors: E.B. Yakimov
• p535 Growth and Properties of Silicon Nanowires for Low-Dimensional Devices   [ 3 M ]
  Authors: P. Werner
• p541 Modification of Silicon Nanocrystals Embedded in an Oxide by High Energy Ion Implantation   [ 180 K ]
  Authors: I.V. Antonova, M.B. Gulyaev, V.A. Skuratov, D.V. Marin, E.V. Zaikina, Z.S. Yanovitskaya, J. Jedrzejewski, I. Balberg
• p547 Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy.   [ 1 M ]
  Authors: Daniela Cavalcoli, Marco Rossi, Andrea Tomasi, Anna Cavallini, Danny Chrastina, Giovanni Isella
• p553 Phonon Confinement and Impurity Doping in Silicon Nanowires Synthesized by Laser Ablation   [ 420 K ]
  Authors: Naoki Fukata, T. Oshima, N. Okada, S. Matsushita, T. Tsurui, J. Chen, Takashi Sekiguchi, K. Murakami