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Structural Characterization of Graphene Grown by Thermal Decomposition of Off-Axis 4H-SiC (0001)

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Abstract:

We present a nanoscale morphological and structural characterization of few layers of graphene grown by thermal decomposition of off-axis 4H-SiC (0001). A comparison between transmission electron microscopy (TEM) in cross-section and in plan view allows to fully exploit the potentialities of TEM. Such a comparison was used to get information on the number of graphene layers as well as on the rotational order between the layers and with respect to the substrate. Some peculiar structures observed by TEM (wrinkles) could only be systematically measured by atomic force microscopy (AFM). In particular, the density and the height of the wrinkles in the few layers of graphene was investigated.

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Periodical:

Materials Science Forum (Volume 711)

Pages:

141-148

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.711.141

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Online since:

January 2012

Authors:

Filippo Giannazzo, Martin Rambach, Wielfried Lerch, Corrado Bongiorno, Salvatore Di Franco, Emanuele Rimini, Vito Raineri

Keywords:

Atomic Force Microscopy (AFM), Graphen, Silicon Carbide (SiC), Transmission Electron Microscopy (TEM)

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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