Paper Title:
Low Temperature Growth of Patterned ZnO Nanowires and their Field Emission Characteristics
  Abstract

Uniformly distributed and quasi-perpendicular patterned ZnO nanowires were synthesized on Ag electrodes coated Si substrate by thermal evaporation. Field emission (FE) measurements show that its turn-on field is 3.65V/µm at current density of 10µA/cm2 and its the threshold field at current density of 1mA/cm2 is about 6.56 V/µm at an emitter-anode gap of 400µm. and the fluctuation of FE current density is smaller than 10% for 3.5h at electric field of 6V/µm. The low turn-on field and good stability indicates that it offers advantages as field emitter for much potential application.

  Info
Periodical
Chapter
Chapter 9: Nanomaterials and Nanomanufacturing
Edited by
Wu Fan
Pages
1918-1922
DOI
10.4028/www.scientific.net/AMM.110-116.1918
Citation
Y. A. Zhang, J. Y. Lin, C. X. Wu, T. L. Guo, "Low Temperature Growth of Patterned ZnO Nanowires and their Field Emission Characteristics", Applied Mechanics and Materials, Vols. 110-116, pp. 1918-1922, 2012
Online since
October 2011
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Gang Li, Wen Ming Cheng
Abstract:Ultra-thin (20 nm) nickel catalyst films were deposited by sputtering on SiO2/Si substrates. At the pretreatments, ammonia (NH3) was...
312
Authors: Yu Zhu, Feng Huang, Shu Gang Sun, Hong Jun Ni
Composites
Abstract:Ceramic-lined steel pipes were made by adding nano-SiO2, Na2B4O7 additives into...
105
Authors: Rui Dong Xu, Da Cheng Zhai, Shuang Li Hu
Chapter 2: Surface Engineering/Coatings
Abstract:Square-wave double pulse current was used to electrodeposit Ni-W-P-CeO2-SiO2 composite coatings in fine-grained...
856
Authors: Wei Deng, Jin Feng Nie, Xi Xiao, Jian Cong Yuan, Bo Ping Zhang, Yuan Hua Lin
Chapter 3: Electrical, Magnetic and Optical Ceramics
Abstract:High density BaTiO3 ceramics have been prepared by the addition of CuO-Bi2O3-B2O3...
1146
Authors: Yuan Xiang Zhang, Jun Wu, Ying Yu Ji
Abstract:This paper investigates the electromigration (EM) induced void and hillock generation in IC interconnect structures. The driving force for...
6