Paper Title:
Increasing the Image Contrast of Atomic Force Microscope by Using Improved Rectangular Micro Cantilever
  Abstract

The resonant frequency of flexural vibrations for an atomic force microscope (AFM) cantilever has been investigated using the Euler-Bernoulli beam theory. The results show that for flexural vibration the frequency is sensitive to the contact position, the first frequency is sensitive only to the lower contact stiffness, but high order modes are sensitive in a larger range of contact stiffness. By increasing the height H, for a limited range of contact stiffness the sensitivity to the contact stiffness increases. This sensitivity controls the image contrast, or image quality. Furthermore, by increasing the angle between the cantilever and sample surface, the frequency decreases.

  Info
Periodical
Chapter
Chapter 23: Computer-Aided Design, Manufacturing, and Engineering
Edited by
Wu Fan
Pages
4888-4892
DOI
10.4028/www.scientific.net/AMM.110-116.4888
Citation
A. Sadeghi, "Increasing the Image Contrast of Atomic Force Microscope by Using Improved Rectangular Micro Cantilever", Applied Mechanics and Materials, Vols. 110-116, pp. 4888-4892, 2012
Online since
October 2011
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