Paper Title:
Ionizing Radiation Testing System for Emerging Semiconductor Materials and Devices
  Abstract

A technical design and implementation method of a ionizing radiation testing system, which is especially applicable to conduct experiments of studying X-ray and γ-ray radiation effects in emerging semiconductor materials and devices, has been demonstrated by connecting components of a PC, a KEITHLEY 487, a HP 8110A, an Agilent 4284A, and a probe station together. The lead thickness of the lead shielding cylinder container is obtained numerically at least 2.1cm for safely holding a 1 GBq Cs137 γ-ray source.

  Info
Periodical
Chapter
Chapter 4: Equipment Manufacturing
Edited by
Jiuba Wen, Fuxiao Chen, Ye Han and Huixuan Zhang
Pages
495-498
DOI
10.4028/www.scientific.net/AMM.120.495
Citation
X. L. Hu, J. K. Gui, C. Z. Zhao, "Ionizing Radiation Testing System for Emerging Semiconductor Materials and Devices", Applied Mechanics and Materials, Vol. 120, pp. 495-498, 2012
Online since
October 2011
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Price
$32.00
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