Paper Title:
Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination
  Abstract

By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability,the testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimization model of system-level BIT testability indexes is established. The multi-objective optimization model is solved using Non-dominated Sorting Genetic Algorithm II, and the validity of the multi-objective optimization model is proved through an example.

  Info
Periodical
Chapter
Chapter 4: Mechatronics and Information
Edited by
Dongye Sun, Wen-Pei Sung and Ran Chen
Pages
2223-2227
DOI
10.4028/www.scientific.net/AMM.121-126.2223
Citation
C. S. Zhu, Q. Zhang, F. T. Su, H. L. Ran, "Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination", Applied Mechanics and Materials, Vols. 121-126, pp. 2223-2227, 2012
Online since
October 2011
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Price
$32.00
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