Paper Title:
The Research and Design of Distributed Automated Test Framework which is Oriented to Embedded Devices
  Abstract

With the development of embedded technology, research for embedded software test techniques and tools is a hot topic in the field of IT. To resolve the the two problems of scarcity of embedded devices and interacting directly with the device, we have designed a distributed automated test framework for embedded communication devices, It has a unique distributed engine to handle a variety of distributed test cases.To compare with the most popular automated test framework QTP (quicktest Professional),we find that our framework has the advantages of directly interact with the embedded devices, higher efficiency and higher accuracy.

  Info
Periodical
Chapter
Chapter 5: Materials in Energy and Environment (2)
Edited by
Dongye Sun, Wen-Pei Sung and Ran Chen
Pages
2998-3002
DOI
10.4028/www.scientific.net/AMM.121-126.2998
Citation
W. H. Hu, H. Y. Yang, "The Research and Design of Distributed Automated Test Framework which is Oriented to Embedded Devices", Applied Mechanics and Materials, Vols. 121-126, pp. 2998-3002, 2012
Online since
October 2011
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Price
$32.00
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