Paper Title:
FPGA Auto Configuration Based on ATE
  Abstract

FPGAs (Field Programmable Gate Arrays) are highly integrated devices which can be programmed as variable functions. The application-level testing of FPGAs usually include multiple reconfigurations and relevant functional tests respectively through ATEs (Automated Test Equipments). However, test engineers are facing a tough problem to reconfigure FPGAs automatically through an ATE instead of using specific tools and download cables provided by FPGAs manufacturers. This paper takes example for XILINX Virtex-E series, presents two different methods for FPGA auto configuration based on an ATE using JTAG configuration interface and boundary-scan protocol, and accomplishes the entire auto configuration-test procedure by a single ATE.

  Info
Periodical
Chapter
Chapter 6: Frontiers of Mechanical Engineering (1)
Edited by
Dongye Sun, Wen-Pei Sung and Ran Chen
Pages
3310-3314
DOI
10.4028/www.scientific.net/AMM.121-126.3310
Citation
Q. Liu, D. Wu, "FPGA Auto Configuration Based on ATE", Applied Mechanics and Materials, Vols. 121-126, pp. 3310-3314, 2012
Online since
October 2011
Authors
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Price
$32.00
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