Paper Title:
Characterization Model for IC Reference Material
  Abstract

Not all of the measurement data of IC (Integrated Circuit) reference material are valid, so some work would be do to eliminate the null and wrong ones. This paper presents an algorithmic model of the characterization for IC reference material, which can help choose the valid data for the property value validated of IC reference material. The experimentation results of the characterization procedure are detailed in the paper, which proves to be helpful steps to IC reference material characterization and preparation.

  Info
Periodical
Chapter
Chapter 2: Advanced Design Science (1)
Edited by
Dongye Sun, Wen-Pei Sung and Ran Chen
Pages
735-739
DOI
10.4028/www.scientific.net/AMM.121-126.735
Citation
T. Zhang, J. Shi, "Characterization Model for IC Reference Material", Applied Mechanics and Materials, Vols. 121-126, pp. 735-739, 2012
Online since
October 2011
Authors
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Mohd Fauzi Ismail, Kazuhisa Yanagi, Hiromi Isobe
Chapter 2: Advanced Materials, Materials Processing and Forming
Abstract:Cutting edges protrusion properties for cutting tools have significant effect of grinding surface finish and its characterization is crucial...
266
Authors: Jing Zhu
Chapter 21: Geology of Oil and Gas, Well Development Projects
Abstract:Production data (pressure and flow rate) contain a large amount of reservoir information. At present only simple production decline analysis...
2263