Paper Title:
Storage Test Techniques and Wireless Transmission Based on Embedded System
  Abstract

Memory test technology is the most effective means to record the parameters of moving objects under special circumstances. This paper introduced the development of storage test systems based on ARM7LPC21XX. PHILIPS chip 16/32-bit microcontroller-LPC21XX was a 16/32-bit ARM7 TDMI-S CPU microcontroller based on a real-time emulation and embedded trace. It had two powers-saving modes-power down and idles, which could ensure the battery to work for a long time. The microcontroller internal 10-bit AD was used to sample data as well as SPI and NRF24L01 modules to realize communication.

  Info
Periodical
Chapter
Chapter 4: Fault Diagnose and Electronmechanical Control
Edited by
Zhixiang Hou
Pages
1020-1024
DOI
10.4028/www.scientific.net/AMM.128-129.1020
Citation
H. Wu, T. Han, C. Wang, "Storage Test Techniques and Wireless Transmission Based on Embedded System", Applied Mechanics and Materials, Vols. 128-129, pp. 1020-1024, 2012
Online since
October 2011
Export
Price
$32.00
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