Paper Title:
A Modified Algorithm for Reducing Calculation Errors in Large Strain Measurement with Strain Gauges
  Abstract

There is no simple linear relationship between strain and potential in strain measurement with strain gauges, especially for large strain measurements. In this paper, a modified algorithm was proposed to improve the accuracy of strain obtained from measured voltage. The strain was calculated from a nonlinear relationship between voltage and strain rather than a linear simplification. Moreover, the corrections for different sensitivity factors of strain gauges and lead wire resistance were considered. The proposed method was suitable for both large and small strain measurements using a quarter bridge, and validated by experimental tests. It is also very easy to be implemented as a software form and used in scientific tests and engineering applications.

  Info
Periodical
Edited by
J.M. Dulieu-Barton, J.D. Lord and R.J. Greene
Pages
261-268
DOI
10.4028/www.scientific.net/AMM.13-14.261
Citation
G. Chen, Y. Deng, L. Sun, T. Xu, "A Modified Algorithm for Reducing Calculation Errors in Large Strain Measurement with Strain Gauges", Applied Mechanics and Materials, Vols. 13-14, pp. 261-268, 2008
Online since
July 2008
Export
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: A. Ajovalasit, L. D'Acquisto, S. Fragapane, B. Zuccarello
Abstract:The reinforcement effect of a strain gauge installed on low modulus materials can be significant. The increasing use of low modulus materials...
349
Authors: Sarwat Z.A. Zahwi, M. Bahrawy, Madyan Amer, N. Farid
Abstract:Vertical metro-scopes using Abbe’s principle AVM are used for different dimensional measurements. The accuracy of their measurement is low...
573
Authors: Ao Yu Chen, Xu Dong Pan, Guang Lin Wang
Abstract:Traditional method of buoy gauge design is rather complicated, so an advanced method by building and solving fluid mechanics equations is...
133
Authors: Oleg Jakovlev, Tino Fuchs, Franziska Rohlfing, Helmut Seidel
Chapter 7: Electrical and Structural Characterization
Abstract:We introduce a novel high temperature PECVD process and use it for the deposition of silicon carbide thin films on oxidized silicon wafers at...
657