Paper Title:
Damage Efficiency Research of PCB Components under Strong Electromagnetic Pulse
  Abstract

To study damage effectiveness of strong electro-magnetic pulse to components of equipments, the power density in area of MOS circuit, diodes and transistor of a computer is simulated, using the method of the finite-difference time-domain (FDTD). Coupling laws in different areas are achieved, and then judging the damage efficiency of components. Electromagnetic pulse reflects constantly in computer box, causing power density appears oscillations. Energy gradually declines to zero, for it radiates outward from slots. Field concentration around PCB board results in dissociation of field strength, and slows down the attenuation of energy. Finally, formula of power density at random field strength and rise time is also obtained.

  Info
Periodical
Edited by
Han Zhao
Pages
1383-1386
DOI
10.4028/www.scientific.net/AMM.130-134.1383
Citation
F. Xie, B. Cao, C. L. Liu, "Damage Efficiency Research of PCB Components under Strong Electromagnetic Pulse", Applied Mechanics and Materials, Vols. 130-134, pp. 1383-1386, 2012
Online since
October 2011
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Price
$32.00
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