Paper Title:
Effects of Aperture Amount and Offset on Couplings of Strong Electromagnetic Pulse
  Abstract

Aperture coupling is a main coupling mode through which strong electromagnetic pulse can disturb and even damage electronic equipments. The amount, offset and mixed shape of aperture arrays can affect the coupling effect, which is analyzed using finite-difference time-domain (FDTD) method. The field strength coupled increases with the decrease of the slot amount when the total area of aperture is unchanged. The shielding effectiveness is the smallest when the electromagnetic pulse reaches the resonant frequency, which is only affected by the actual structure size of the shielding cavity. Comparing to two direction offset, the single achieved much larger field strength, which is symmetrical about offset center. The coupled field strength is the smallest when the shape of aperture arrays contains round and rectangular.

  Info
Periodical
Edited by
Han Zhao
Pages
1387-1390
DOI
10.4028/www.scientific.net/AMM.130-134.1387
Citation
X. P. Zhu, B. Cao, C. L. Liu, "Effects of Aperture Amount and Offset on Couplings of Strong Electromagnetic Pulse", Applied Mechanics and Materials, Vols. 130-134, pp. 1387-1390, 2012
Online since
October 2011
Export
Price
$35.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Asghar Keshtkar, Amir Maghoul, Ali Kalantarnia, Negar Elmiye Sadr
Chapter 4: Surface, Subsurface, and Interface Phenomena
Abstract:Electromagnetic compatibility is achieved by reducing the interference below the level that disrupts the proper operation of the electronic...
940
Authors: Qun Yu, Ya Di Wang, Ji Hong Han, Hong Shan Kong, Yu Chen Zhang
Chapter 21: Laser Based Manufacturing
Abstract:By using electromagnetic topology (EMT) method, this paper discusses the issue of the electromagnetic field penetration through an aperture...
4133
Authors: Jian Hua Zhang, Wei Hu
Chapter 1: Computer-Aided Manufacturing
Abstract:Based on the field equivalence principle and the potential function, the axial normalized pulsed power density of the microwave radiated from...
638
Authors: Yin Han Gao, Jun Jie Gu, Kai Yu Yang, Ji Zhi Li, Hang Zhang
Chapter 3: Electromagnetic Measurement and Resistance Measurement
Abstract:In the design and production process of car’s electronic equipment, the SE of the shield is reduced greatly for the existence of...
274
Authors: Yin Han Gao, Jun Jie Gu, Kai Yu Yang, Hang Zhang
Chapter 3: Electromagnetic Measurement and Resistance Measurement
Abstract:The SE of the shield is reduced greatly for the existence of aperture in the electronic equipment design process. The shielding...
283