Paper Title:
Research on the Properties of NiZnO Thin Films
  Abstract

NiZnO thin films had been fabricated on c-plane sapphire substrates using photo-assisted metal organic chemical vapour deposition system. The crystal quality of the films had been improved greatly comparing to the results in earlier reports. The crystal structure analysis indicated the NiZnO kept the basic wurtzite structure until the content of Ni attained 0.18. The crystal and electrical properties of the films showed the content of Ni had an important effect on the properties of NiZnO films.

  Info
Periodical
Edited by
Han Zhao
Pages
1491-1494
DOI
10.4028/www.scientific.net/AMM.130-134.1491
Citation
X. Dong, J. Wang, H. Wang, Z. F. Shi, L. Zhao, "Research on the Properties of NiZnO Thin Films", Applied Mechanics and Materials, Vols. 130-134, pp. 1491-1494, 2012
Online since
October 2011
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