Paper Title:
BISS: A Built-In SEU Sensor for Soft Error Mitigation
  Abstract

This paper presents a built-in SEU sensor (BISS) to detect soft errors in CMOS digital systems. BISS detects SEU-induced soft errors by monitoring the meta-stability in the flip-flops. BISS includes positive pulse generator, footed dynamic inverter and keeper. SPICE simulations validate the approach. Experiments show minor overhead in terms of area. BISS can yield 80% error coverage at the cost of 22% area overhead. As its prominent advantage, insertion of BISS will incur minimal performance degradation.

  Info
Periodical
Edited by
Han Zhao
Pages
4228-4231
DOI
10.4028/www.scientific.net/AMM.130-134.4228
Citation
Z. F. Huang, M. X. Yi, "BISS: A Built-In SEU Sensor for Soft Error Mitigation", Applied Mechanics and Materials, Vols. 130-134, pp. 4228-4231, 2012
Online since
October 2011
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