Optical Characterization and XPS Study of ZnGa2O4 Thin Films for Organic Solar Cells
| Periodical | Applied Mechanics and Materials (Volumes 143 - 144) |
|---|---|
| Main Theme | Electrical Information and Mechatronics and Applications |
| Edited by | Xudong Wang, Baoyu Xu and Shaobo Zhong |
| Pages | 199-203 |
| DOI | 10.4028/www.scientific.net/AMM.143-144.199 |
| Citation | Zhi You Zhong et al., 2011, Applied Mechanics and Materials, 143-144, 199 |
| Online since | December, 2011 |
| Authors | Zhi You Zhong, C.Y. Yang, J.H. Gu |
| Keywords | Doped ZnO Thin Films, Optical Property, Transmission, XPS Spectra |
| Price | US$ 28,- |
Transparent conductive ZnGa2O4 thin films were prepared by magnetron sputtering. The chemical state of O, Zn and Ga in the deposited films was investigated by X-ray photoelectron spectroscopy (XPS), and the optical properties were characterized by optical transmittance spectra. The XPS studies reveal that no metallic Zn and Ga were detected in the ZnGa2O4 thin films, and Zn and Ga exist only in oxidized state. The optical bandgap was calculated by Tauc's theory and the optical constants were determined using Swanepoel's method. Furthermore, the dispersion behavior of the refractive index was studied by means of single-oscillator model, and the physical parameters and the refractive index dispersion parameter were obtained. The results provide some useful references for the potential application of the ZnGa2O4 thin films in optoelectronic devices.
