Paper Title:
Test Generation for Glitch Faults of Crosstalk Effects in Digital Circuits Based on Genetic Algorithm with Niche
  Abstract

The more signal path ways close to each other in digital circuits, the greater the coupling effects. The coupling effects can led to an increasing number of signal integrity related faults such as crosstalk faults. In this paper, the glitch faults of crosstalk effects are studied. First of all, the test vector generation using signal paths of circuits is given. Secondly, a new test method for crosstalk faults in digital circuits is presented, which is based on the genetic algorithm with niche. The test method can detect the maximal crosstalk effects, i.e. the test vectors to be produced is to switch a set of aggressors that maximizes the switching of total coupling effects. The test method is also used to produce the test vectors of multiple crosstalk faults. The experimental results show that the method proposed in this paper can get the test vectors of the multiple crosstalk faults if the faults are testable.

  Info
Periodical
Edited by
Qi Luo
Pages
647-652
DOI
10.4028/www.scientific.net/AMM.20-23.647
Citation
Z. L. Pan, L. Chen, "Test Generation for Glitch Faults of Crosstalk Effects in Digital Circuits Based on Genetic Algorithm with Niche", Applied Mechanics and Materials, Vols. 20-23, pp. 647-652, 2010
Online since
January 2010
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