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Proposal of Compact Optical System Using Planar Lightwave Circuit for Precision Measurement Based on Levitation Mass Method

Journal Applied Mechanics and Materials (Volume 36)
Volume Precision Instrumentation and Measurement
Edited by Yusaku Fuji and Koichi Maru
Pages 329-336
DOI 10.4028/www.scientific.net/AMM.36.329
Citation Koichi Maru et al., 2010, Applied Mechanics and Materials, 36, 329
Online since October, 2010
Authors Koichi Maru, Yusaku Fujii
Keywords Levitation Mass Method, Planar Lightwave Circuit, Precision Measurement
Abstract

A method for reducing the size and cost of optical system for precision measurement based on the Levitation Mass Method (LMM) is proposed. In the LMM, a mass levitated using a pneumatic linear bearing with sufficiently small friction is made to collide with the object being tested. The velocity and acceleration of the mass are measured using a compact optical interferometer. The size of the optical system can be drastically reduced by using a planar lightwave circuit (PLC), in which several optical elements are arranged on a planar surface of a silica or semiconductor substrate. Several applications of the PLC to precision measurement will be discussed.

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