Paper Title:
Built-in Self-Test Design for Fault Detection of MUXFXs in SRAM-Based FPGAs
  Abstract

This paper proposes a built-in self-test (BIST) design for MUXFXs in SRAM-based FPGAs. This approach can test both the interconnect resources and MUXFXs in the configurable logic blocks (CLBs). Because the test pattern generator (TPG) and output response analyzer (ORA)are configured by existing CLBs in FPGAs, no extra area overhead is needed for the proposed BIST structure. Open/short , stuck on/off faults in PSs, and stuck-at-0/1 faults in MUXFXs will be detected through the target fault detection/diagnosis of the proposed BIST structure.

  Info
Periodical
Edited by
Yuanzhi Wang
Pages
220-225
DOI
10.4028/www.scientific.net/AMM.39.220
Citation
S. Hong, W. H. Tao, Y. P. Qi, C. Gao, X. Z. Liu, J. Y. Huang, D. Zhang, "Built-in Self-Test Design for Fault Detection of MUXFXs in SRAM-Based FPGAs", Applied Mechanics and Materials, Vol. 39, pp. 220-225, 2011
Online since
November 2010
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