Paper Title:
Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method
  Abstract

Residual stress determination by X-ray diffraction is theoretically analyzed. Using stress of two directions analysis method, the magnitude and direction of the principal stress which is induced by laser shocked wave can be calculated. The results indicate that the calculated value consists with that of the experimental data, which shows that the surface stresses state comprehensively. Meanwhile, the relationship between the principle stress and single stress with different energies are analyzed.

  Info
Periodical
Edited by
Long Chen, Yongkang Zhang, Aixing Feng, Zhenying Xu, Boquan Li and Han Shen
Pages
569-572
DOI
10.4028/www.scientific.net/AMM.43.569
Citation
A. X. Feng, H. Y. Sun, Y. P. Cao, C. C. Xu, G. F. Ni, J. W. Wang, P. C. Zhou, "Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method", Applied Mechanics and Materials, Vol. 43, pp. 569-572, 2011
Online since
December 2010
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