Paper Title:
Influence of Thermal Annealing Atmosphere on Electrical Properties of Polycrystalline Silicon Grain Boundaries
  Abstract

  Info
Periodical
Edited by
M. Zahir
Pages
399-404
DOI
10.4028/www.scientific.net/AMR.1-2.399
Citation
N. M'Gafad, H. Amzil, B.M. Semega, D. Sayah, "Influence of Thermal Annealing Atmosphere on Electrical Properties of Polycrystalline Silicon Grain Boundaries", Advanced Materials Research, Vols. 1-2, pp. 399-404, 1994
Online since
September 1994
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Price
$32.00
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