Paper Title:
Challenges in Reliability Assessment for Electronics
  Abstract

There has been a growing interest in assessing the ongoing reliability of electronics and systems in order to predict failures and provide warning to avoid catastrophic failure. Methods based on prognostics and health management shows an enabling technology to assess the reliability of electronics and systems under its actual application conditions. However, many challenges in implementation of methods based on PHM still remain including: environmental and usage profiles for life-cycle loads, identification of failure mechanism, identification of failure PoF model, identification of parameters to be monitored, approaches to anomaly detection. These challenges were presented and discussed, and would be carried out by developing methodologies and techniques.

  Info
Periodical
Advanced Materials Research (Volumes 118-120)
Edited by
L.Y. Xie, M.N. James, Y.X. Zhao and W.X. Qian
Pages
419-423
DOI
10.4028/www.scientific.net/AMR.118-120.419
Citation
Q. C. He, W. H. Chen, J. Pan, S. J. Wang, "Challenges in Reliability Assessment for Electronics", Advanced Materials Research, Vols. 118-120, pp. 419-423, 2010
Online since
June 2010
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Price
$32.00
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