Paper Title:
A Modified Wavelet Transform Profilometry
  Abstract

To overcome the noisy background comes from surface reflection, spectrum overlapping and dust noisy. In this paper, a novel modified continuous wavelet transform profilometry is proposed, which employs a fringe image and a flat image to eliminate the background. Both the fringe and flat pattern are projected onto the object by a projector. With the subtraction of the flat image from the fringe image, the background is completely removed and the spectrum overlapping in the frequency domain is prevented. Experimental results showed that the proposed method got a better result than the traditional CWT.

  Info
Periodical
Edited by
Dunwen Zuo, Hun Guo, Hongli Xu, Chun Su, Chunjie Liu and Weidong Jin
Pages
140-143
DOI
10.4028/www.scientific.net/AMR.136.140
Citation
C. Y. Liu, B. Zhou, X. M. Zhao, "A Modified Wavelet Transform Profilometry", Advanced Materials Research, Vol. 136, pp. 140-143, 2010
Online since
October 2010
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