Paper Title:
Reliability of Non Damage Testing and Calculating Method of the Original Defect Size
  Abstract

In this article, factors that influence the reliability of non damage testing is studied, and a method was developed to calculate the reliability of non damage testing. More over, a method based on the reliability of non damage testing was developed to calculate the possible maximum size of defect. This study will offer original defect size data to the safety assessment.

  Info
Periodical
Advanced Materials Research (Volumes 146-147)
Edited by
Sihai Jiao, Zhengyi Jiang and Jinglong Bu
Pages
1300-1304
DOI
10.4028/www.scientific.net/AMR.146-147.1300
Citation
Q. G. Liu, X. Q. Yu, S. M. Shen, "Reliability of Non Damage Testing and Calculating Method of the Original Defect Size", Advanced Materials Research, Vols. 146-147, pp. 1300-1304, 2011
Online since
October 2010
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Shan Suo Zheng, Zhi Qiang Li, Qing Lin Tao, Yi Hu, Pi Ji Hou
Abstract:Fuzzy techniques and AHP approach have been widely used during the last decade. However, few papers have attempted to use the AHP approach...
5637
Authors: Xiao Ling Shi, Ji Long Xie, Fang Wei Zhao, Rong Quan Yu
Chapter 10: Mechanics of Materials
Abstract:We usually calculate the fatigue damage by superimposed respective injury; the paper brings up the superimposed load spectrum method...
1367
Authors: Warakorn Praepattharapisut, Weera Pengchan, Toempong Phetchakul, Amporn Poyai
Chapter 2: Electronics and Microelectronics
Abstract:This paper presented the corresponding between the yield equation prediction from Poisson, Murphy with wafer actual yield on the silicon...
160