Paper Title:
Study on Microstructure Characterization of Al-N Codoping ZnO Films and Doping Mechanism
  Abstract

Al-N codoped ZnO thin films were prepared by sol-gel method, which microstructure were characterized by AFM and XPS, on the basis of the result, doping mechanism of Al-N co-doped thin film is: the formation of the first occurrence of Al was replacing doping system of Zn, and it is conducive for N element in the system to the solution along with the increasing of Al doping concentration.

  Info
Periodical
Advanced Materials Research (Volumes 152-153)
Edited by
Zhengyi Jiang, Jingtao Han and Xianghua Liu
Pages
813-816
DOI
10.4028/www.scientific.net/AMR.152-153.813
Citation
Y. Xu, W. Juan, Y. B. Dou, "Study on Microstructure Characterization of Al-N Codoping ZnO Films and Doping Mechanism", Advanced Materials Research, Vols. 152-153, pp. 813-816, 2011
Online since
October 2010
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Price
$32.00
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