Paper Title:
Degradation Screening Test Design for Electronic Products
  Abstract

Long-life electronic products need to be put in stress environment for long durations in traditional ESS(environmental stress screening) tests in order that items having infant mortality or defects are weeded out from products. However, long stress durations cause aging effects on good items. For some products, failures are defined in terms of performance characteristics degrading some critical values. For the purpose of reducing durations and aging effects, this paper analyzes the difference of performance characteristics between normally degraded products and abnormally degraded products, and assumes the distribution of products’ degradation characteristic variable is contaminated distribution model, then presents a degradation screening test design. This design firstly ascertains the model coefficient using identifiable condition of contaminated distribution combined with the analysis of degradation test, then ascertains screen duration and screen critical value. Lastly, this paper gives an example to illustrate the availability of the design.

  Info
Periodical
Advanced Materials Research (Volumes 156-157)
Edited by
Jingtao Han, Zhengyi Jiang and Sihai Jiao
Pages
747-753
DOI
10.4028/www.scientific.net/AMR.156-157.747
Citation
R. L. Lin, Q. H. Zhong, "Degradation Screening Test Design for Electronic Products", Advanced Materials Research, Vols. 156-157, pp. 747-753, 2011
Online since
October 2010
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Mu Chun Wang, Hsin Chia Yang
Laser Processing Technology
Abstract:Continuous-wave green laser-crystallized (CLC) single-grainlike polycrystalline silicon n-channel thin-film transistors (poly-Si n-TFTs)...
1926
Authors: Hua Cong, Guang Ping Wu, Fu Zhou Feng, Guo Qiang Rao
Chapter 9: Information System for Materials and Mechanics
Abstract:This paper presents a reliability assessment method for the system with multiple degradation parameters based on SVDD and SVR. The method...
1187
Authors: Cheng Gao, Min Jiang, Jiao Ying Huang, Xiang Fen Wang
Chapter 4: Mechatronics and Information
Abstract:In accelerated degradation test, it is essential to establish a suitable degradation path model of the component. In order to predict the...
2205
Authors: Jun Wu, Chao Deng, Huan Xiong, Yao Xiong
Abstract:Performance degradation; Time series; Reliability prediction; Non-stationary data. Abstract. Performance degradation model has become a...
24
Authors: Hong Peng
Chapter 14: Chemical Thermodynamics and Kinetics
Abstract:Cellulose is one of the main components of renewable lignocellulosic biomass. Functional cellooligosaccharides obtained from the hydrolysate...
2638