Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition
| Periodical | Advanced Materials Research (Volume 159) |
|---|---|
| Main Theme | Micro Nano Devices, Structure and Computing Systems |
| Edited by | Dehuai Zeng |
| Pages | 377-382 |
| DOI | 10.4028/www.scientific.net/AMR.159.377 |
| Citation | Guang Tao Ge, 2010, Advanced Materials Research, 159, 377 |
| Online since | December, 2010 |
| Authors | Guang Tao Ge |
| Keywords | Bidimensional Empirical Mode Decomposition, Infinite Sifting, Mean Envelope Operation, Over-Sifting |
| Price | US$ 28,- |
Define the course of getting mean envelope as an operation (mean envelope operation) in Empirical mode decomposition (EMD), so as to express the Intrinsic Mode Function (IMF) with mean envelopes. Summarize several rules of the mean envelope operation. On this fundamental, the abnormal components exist in the over-sifting IMFs are extracted out, and the conclusion is testified with the infinite sifting experiment.