Paper Title:

Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition

Periodical Advanced Materials Research (Volume 159)
Main Theme Micro Nano Devices, Structure and Computing Systems
Edited by Dehuai Zeng
Pages 377-382
DOI 10.4028/www.scientific.net/AMR.159.377
Citation Guang Tao Ge, 2010, Advanced Materials Research, 159, 377
Online since December, 2010
Authors Guang Tao Ge
Keywords Bidimensional Empirical Mode Decomposition, Infinite Sifting, Mean Envelope Operation, Over-Sifting
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Abstract

Define the course of getting mean envelope as an operation (mean envelope operation) in Empirical mode decomposition (EMD), so as to express the Intrinsic Mode Function (IMF) with mean envelopes. Summarize several rules of the mean envelope operation. On this fundamental, the abnormal components exist in the over-sifting IMFs are extracted out, and the conclusion is testified with the infinite sifting experiment.