Paper Title:
Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition
  Abstract

Define the course of getting mean envelope as an operation (mean envelope operation) in Empirical mode decomposition (EMD), so as to express the Intrinsic Mode Function (IMF) with mean envelopes. Summarize several rules of the mean envelope operation. On this fundamental, the abnormal components exist in the over-sifting IMFs are extracted out, and the conclusion is testified with the infinite sifting experiment.

  Info
Periodical
Edited by
Dehuai Zeng
Pages
377-382
DOI
10.4028/www.scientific.net/AMR.159.377
Citation
G. T. Ge, "Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition", Advanced Materials Research, Vol. 159, pp. 377-382, 2011
Online since
December 2010
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