Paper Title:
Shape Analysis of the Raw Silk Defects
  Abstract

The detection of raw silk defects is important in the quality inspection of raw silk. Electronic inspection is a popular method now for the reasons of high speed and objectivity. However, the traditional seriplane testing method is also applied in many countries for its advantages that the electronic inspection method haven’t. Due to the different evaluation standards, different results will be derived when the same raw silk defect is detected by the two different methods. In this study, various raw silk defects were detected according to the two different methods or standards. The cause of different results derived by different detection method was analyzed through observing the actual shape of the raw silk defects under the microscope. This is favorable to the development of electronic inspection method and standards for the raw silk defects.

  Info
Periodical
Advanced Materials Research (Volumes 175-176)
Main Theme
Edited by
Lun Bai and Guo-Qiang Chen
Pages
429-433
DOI
10.4028/www.scientific.net/AMR.175-176.429
Citation
K. N. Xiao, J. Li, Q. G. Chen, K. Meng, "Shape Analysis of the Raw Silk Defects", Advanced Materials Research, Vols. 175-176, pp. 429-433, 2011
Online since
January 2011
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Zhong Quan Zou, Xu Wang, Zhi Mei Wang
Chapter 11: Structural Reliability, Identification and Damage Detection
Abstract:Concrete Filled Steel Tube(CFST) is widely used in civil engineering structures because of its superior mechanical performance. Yet the...
1025
Authors: Wojciech Jóźwik, Tomasz Samborski
Chapter 2: Technologies and Mechatronic Devices for Quality Inspection and Measurements in Industry
Abstract:The article presents the results of the influence of geometrical features of defects in materials on the level of identification by the eddy...
136