Paper Title:
Development of Electronic Real-Time Inspecting System for Raw Silk Based on FPGA
  Abstract

Traditional seriplane testing method has been used to detect the evenness and defects of raw silk for a long time, the results of which are affected subjectively by the examiner to a certain extent and are controversial. In this paper, improved based on SD-1 size tester of raw silk, built-in FPGA chip and 9004 real-time controller and winding machine are used to develop a fast real-time inspecting system for evenness, cleanness and neatness of raw silk. This can resolve the problems of the independent intellectual property rights of sensors and process software troubling electronic inspection of raw silk, and realize the conversion, acquisition, real-time differentiation, results display and storage of continuous dynamic voltage signal of raw silk. Compared with the same type device, this system has a higher processing efficiency and better results objectivity.

  Info
Periodical
Advanced Materials Research (Volumes 175-176)
Main Theme
Edited by
Lun Bai and Guo-Qiang Chen
Pages
460-464
DOI
10.4028/www.scientific.net/AMR.175-176.460
Citation
X. Liu, W. Z. Wei, Q. G. Chen, "Development of Electronic Real-Time Inspecting System for Raw Silk Based on FPGA", Advanced Materials Research, Vols. 175-176, pp. 460-464, 2011
Online since
January 2011
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Price
$32.00
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