Paper Title:
Analysis on Photoelectric Method of Measuring the Fineness of Raw Silk
  Abstract

In order to precisely measure the fineness of raw silk, some features of raw silk are analyzed. By use of Fresnel principle, diffractions caused by raw silk in different conditions are analyzed and simulated. Image data of the fineness of raw silk measured by CMOS image sensor is analyzed for obtaining precise result. Finally, some suggestions are proposed for photoelectric measuring the fineness of raw silk.

  Info
Periodical
Advanced Materials Research (Volumes 175-176)
Main Theme
Edited by
Lun Bai and Guo-Qiang Chen
Pages
565-569
DOI
10.4028/www.scientific.net/AMR.175-176.565
Citation
W. C. Fei, Y. G. Zheng, W. Li, X. X. Lu, "Analysis on Photoelectric Method of Measuring the Fineness of Raw Silk", Advanced Materials Research, Vols. 175-176, pp. 565-569, 2011
Online since
January 2011
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Price
$32.00
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Authors: Chun Wei Liu, Li Qing Li
Abstract:In this paper, a method of automatic inspection of silk spinning yarn fineness through image processing was developed. The acquired images...
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