Paper Title:
The Improved Algorithm of Scale Invariant Feature Transform on Palmprint Recognition
  Abstract

This paper presents a new method of palmprint recognition based on improved scale invariant feature transform (SIFT) algorithm which combines the Euclidean distance and weighted sub-region. It has the scale, rotation, affine, perspective, illumination invariance, and also has good robustness to the target's motion, occlusion, noise and other factors. Simulation results show that the recognition rate of the improved SIFT algorithm is higher than the recognition rate of SIFT algorithm.

  Info
Periodical
Edited by
Wenya Tian and Linli Xu
Pages
565-569
DOI
10.4028/www.scientific.net/AMR.186.565
Citation
Z. Qu, Z. Y. Wang, "The Improved Algorithm of Scale Invariant Feature Transform on Palmprint Recognition", Advanced Materials Research, Vol. 186, pp. 565-569, 2011
Online since
January 2011
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