Paper Title:
Simulation for Aberration of Chromium Atomic Beam Focusing and Deposition
  Abstract

The image distortion which comes from aberration is analyzed and the effects on focal line features are also discussed, which are resulted from the spherical aberration, chromatic aberration and beam spread. The simulation results have show that source imperfection, especially the transverse velocity spread, plays a critical role in broadening the feature width.

  Info
Periodical
Advanced Materials Research (Volumes 189-193)
Edited by
Zhengyi Jiang, Shanqing Li, Jianmin Zeng, Xiaoping Liao and Daoguo Yang
Pages
4191-4194
DOI
10.4028/www.scientific.net/AMR.189-193.4191
Citation
W. T. Zhang, J. Huang, B. H. Zhu, Y. Y. Wu, X. Huang, "Simulation for Aberration of Chromium Atomic Beam Focusing and Deposition", Advanced Materials Research, Vols. 189-193, pp. 4191-4194, 2011
Online since
February 2011
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$32.00
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