Paper Title:
Growth of Double-Side Tl-2212 Thin Film on CeO2-Buffered MgO Substrate
  Abstract

The double-side Tl-2212 films were fabricated on CeO2-buffered MgO substrates by dc magnetron sputtering and post-annealing method. The RF magnetron sputtering technology was used to grow CeO2 buffer layers. XRD and SEM measurements showed that the CeO2 films on annealed MgO substrates were highly c-axis orientation, and the Tl-2212 superconducting films on both sides had similar morphology and crystalline structure. For both sides of Tl-2212 films, the critical transition temperatures (Tc) were above 106 K, and the critical current densities (Jc) were above 2.2 MA/cm2 (77 K, 0 T).

  Info
Periodical
Advanced Materials Research (Volumes 194-196)
Edited by
Jianmin Zeng, Taosen Li, Shaojian Ma, Zhengyi Jiang and Daoguo Yang
Pages
2384-2387
DOI
10.4028/www.scientific.net/AMR.194-196.2384
Citation
Q. L. Xie, Y. T. Zhang, F. C. Fang, G. H. Huang, L. Ji, X. J. Zhao, L. Fang, S. L. Yan, "Growth of Double-Side Tl-2212 Thin Film on CeO2-Buffered MgO Substrate", Advanced Materials Research, Vols. 194-196, pp. 2384-2387, 2011
Online since
February 2011
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Price
$32.00
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