Paper Title:
Electrochemical Properties of NiO thin Film Prepared by Sol-Gel Process
  Abstract

The thermal decomposition behavior of gel precursor, the structure, morphology and electrochemical properties of NiO thin films prepared by sol-gel process were characterized by thermogravimetric/differential scanning calorimetry (TG-DSC), X-ray diffraction (XRD), scanning electron microscopy (SEM) and constant current charge-discharge techniques. The results show that the gel precursor completely decomposes and gradually forms the nanocrystalline NiO at 450°C during the sintering. The NiO thin film is smooth, uniform and free of cracks drying at 200°C as pretreatment and sintering at a low temperature rise rate. The structure of NiO films sintered at 500°C for 2h becomes integrity, whose discharge capacity after 20 cycles remains at 714mAh/g. It is promising to be used in Li-ion battery for great initial specific capacity and well cycle performances.

  Info
Periodical
Advanced Materials Research (Volumes 194-196)
Edited by
Jianmin Zeng, Taosen Li, Shaojian Ma, Zhengyi Jiang and Daoguo Yang
Pages
2487-2490
DOI
10.4028/www.scientific.net/AMR.194-196.2487
Citation
J. N. Zhu, S. L. Zhao, J. B. Wen, Z. Y. Wu, "Electrochemical Properties of NiO thin Film Prepared by Sol-Gel Process", Advanced Materials Research, Vols. 194-196, pp. 2487-2490, 2011
Online since
February 2011
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Price
$32.00
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